Current Status and Future Direction of the High-Temperature Resistance in Wheat to Control Stripe Rust.

This review summarises the current advances and future perspectives on high-temperature resistance in wheat against stripe rust, caused by the airborne fungal pathogen Puccinia striiformis f. sp. tritici (Pst). High-temperature resistance, comprising high-temperature adult-plant (HTAP) and high-temperature all-stage (HTAS) resistance, is critical for durable disease control. HTAP resistance occurs in adult plants at relatively high temperatures, whereas HTAS resistance acts across all growth stages at relatively high temperatures. Genetic mapping has identified numerous HTAP-resistance genes and quantitative trait loci (QTLs) in various chromosomal regions, especially in the B subgenome. Cloned genes, such as Yr18, Yr36 and Yr46, reveal mechanisms involving cell necrosis induction, photosynthesis modulation and nutrient transportation. For HTAS resistance, defence-related factors such as nucleotide-binding site-leucine-rich repeat proteins, transcription factors and receptor-like kinases that mediate resistance via plant-pathogen interactions have been identified; however, research on identifying the genes or QTLs that can be used in breeding programmes is limited. To overcome host defence, Pst secretes effectors that suppress high-temperature resistance by targeting host proteins. Future research should focus on novel gene mining, regulatory network deciphering, effector-host interaction studies and breeding applications via marker-assisted selection and gene editing.

© 2025 The Author(s). Molecular Plant Pathology published by British Society for Plant Pathology and John Wiley & Sons Ltd.